Patent Term at Risk? Navigating OTDP’s Impact on PTA, PTE, and Reissue in Light of Recent Federal Circuit Decisions (RECORDING)

Recorded On: 11/20/2025

Recent Federal Circuit decisions have significant implications for patent term adjustment (PTA), patent term extensions (PTE), and reissue practice when obviousness-type double patenting (OTDP) is at play. This webinar will examine how OTDP challenges affect term decisions and portfolio management, analyze key cases shaping these doctrines, and provide practical pathways for mitigating risk. Attendees will learn strategies to preserve patent term, navigate reissue filings, and adapt to evolving jurisprudence impacting life sciences and technology patents.

Lauren J. Robinson

Partner

Finnegan, Henderson, Farabow, Garrett & Dunner, LLP

Lauren Robinson is a partner in Finnegan, Henderson, Farabow, Garrett & Dunner’s Washington DC office. She is experienced in intellectual property litigation and transactional matters. She focuses on complex patent litigation before U.S. district courts and post-grant proceedings before the Patent Trial and Appeal Board (PTAB) of the U.S. Patent and Trademark Office (USPTO) in a variety of technologies, including the chemical and pharmaceutical fields. In particular, she has extensive district court litigation experience involving energy technologies, catalytic processes, and representing pharmaceutical patent holders in litigations arising under the Hatch-Waxman Act, which governs the approval of pharmaceutical products.

Mark Twilley

Senior IP Counsel

Dow Chemical Co.

Mark Twilley is an experienced legal professional specializing in intellectual property, currently serving as Senior Intellectual Property Counsel at Dow since January 2019. Past roles include Intellectual Property Counsel at Price Heneveld LLP, where responsibilities encompassed patent preparation and prosecution across various engineering disciplines and training new attorneys. Mark's legal career began with positions including Summer Associate at Harness, Dickey & Pierce and Intellectual Property Legal Extern at Michigan State University Technologies. Educational credentials include a J.D. in Patent Law from Michigan State University College of Law and a B.S. in Materials Science and Engineering from Michigan Technological University.

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Patent Term at Risk? Navigating OTDP’s Impact on PTA, PTE, and Reissue in Light of Recent Federal Circuit Decisions (RECORDING)
Open to view video.  |  60 minutes
Open to view video.  |  60 minutes
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4 Questions CLE credit will be available for registered attendees only. If you would like CLE credit for this webinar, please complete the following questions. IPO will apply for CLE for all live programs in the majority of the states that require CLE. IPO will not be applying for CLE in the states of Florida, South Carolina, West Virginia, or Texas (attorneys in TX may submit up to 5 hours of self-study credit). Once IPO has received approval from the state(s) CLE boards , certificate(s) of attendance will be available for download from your dashboard.
CA Certificate of Attendance
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Up to 1.00 CLE credits available  |  Certificate available California has approved this course for 1 hour of CLE credit. Only registered attendees that viewed this course are eligible to claim credit. To claim your credit, select "Claim Credit" then "View/Print Certificate" for your records.
CT Certificate of Attendance
Up to 1.00 CLE credits available  |  Certificate available
Up to 1.00 CLE credits available  |  Certificate available This course was approved in Virginia, a CT approved jurisdiction, for 1 hour of CLE credit. Only registered attendees that viewed the on-demand program are eligible to claim credit. To claim your credit, select “claim credits” and then “view/print your certificate” for your records.
IL Certificate of Attendance
Up to 1.00 CLE credits available  |  Certificate available
Up to 1.00 CLE credits available  |  Certificate available Illinois has approved this course for 1 hour of CLE credit. Only registered attendees that viewed the course are eligible to claim credit. To claim credit, select "Claim Credit" then "View/Print Certificate" for your records.
NY Certificate of Attendance
Up to 1.00 CLE credits available  |  Certificate available
Up to 1.00 CLE credits available  |  Certificate available This course was approved in Virginia, a NY approved jurisdiction, for 1 hour of CLE credit. Only registered attendees that viewed the program are eligible to claim credit. To claim your credit, select “claim credits” and then “view/print your certificate” for your records.
VA Certificate of Attendance
Up to 1.00 CLE credits available  |  Certificate available
Up to 1.00 CLE credits available  |  Certificate available Virginia has approved this course for 1 hour of CLE credit. Only registered attendees that viewed the course are eligible to claim credit. To claim your credit, select "Claim Credit" then "View/Print Certificate" for your records.